| 摘要 |
The present invention is directed to provide an LED chip classifying apparatus, capable of accurately testing performances of LED chips and classifying those tested LED chips. To this end, the present invention provides an LED chip classifying apparatus for measuring properties of an LED chip and then classifying LED chips, the apparatus comprising: a supply section including a seat member for an LED chip to rest thereon, the supply section rotating the seat member to a loading position where an LED chip is loaded on the seat member, to a testing position where the LED chip is tested and to an unloading position where the LED chip is unloaded from the seat member; a loading section installed beside the supply section, so as to deliver an LED chip to be tested from the loading position to the seat member; a testing section installed beside the supply section, so as to measure properties of the LED chip in the testing position; and an unloading section installed beside the supply section, so as to collect tested LED chips from the seat member in the unloading position. |
