发明名称 METHODS OF DETERMINING QUALITY OF A LIGHT SOURCE
摘要 Methods for determining a quality of a light source applied to a photolithographic process are provided. An image sensor array is exposed to a light from a light source. Addresses and respective intensities corresponding to a plurality of locations on a pupil map representing intensity of the light from on the image sensor array. At least one of an inner curve and an outer curve of the pupil map is defined based upon the collected addresses and respective intensities. The light source is applied to a photolithographic process if the addresses have a predetermined pattern relative to the at least one of the inner curve and the outer curve.
申请公布号 US2010214547(A1) 申请公布日期 2010.08.26
申请号 US20100773143 申请日期 2010.05.04
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 CHEN NAN-JUNG;JUI-CHUNG PENG;HUNG KEVIN;YANG AN-KUO
分类号 G03B27/54 主分类号 G03B27/54
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