| 摘要 |
<p>Provided is a test apparatus that tests devices to be tested, and that is provided with a first terminal group and a second terminal group that have multiple signal I/O parts, each of which outputs a signal to a terminal of a tested device and to which a signal output from the terminal is input, a measurement part that measures the difference in signal I/O reference phases for each pair of the first terminal group signal I/O parts and the second terminal group signal I/O parts connected to each other when the respective signal I/O parts of the first terminal group and the respective signal I/O parts of the second terminal group are connected to each other, and an adjustment part that brings the reference phases close to each other based on the difference in reference phases for each pair of first terminal group signal I/O parts and second terminal group signal I/O parts connected to each other.</p> |
