| 摘要 |
A testing apparatus for testing perpendicularity of an end surface of a workpiece is disclosed. The testing apparatus includes an electrically conductive first reference piece defining two guide holes, and two testing units. The testing units are slidably engaged in the guide holes, so as to form two testing circuits. At a normal state, each testing circuit is closed, and each testing unit extends out of the guide hole for a distance, wherein the distance corresponds to an allowable perpendicularity tolerance. Each testing unit can be pushed to retract back to the guide holes by the end of the workpiece to cause the testing circuit to be opened. The opened state or closed state of each of the testing circuits will help show the status of the perpendicularity of the end surface of the workpiece.
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