发明名称 Quantum-imaging system and mode of operation and method of fabrication thereof
摘要 A quantum-imaging system for detecting photons, including short-wavelength (<1 nm) photons, is provided. A quantum imaging system can include optical read-out and optical means, and can be configured to perform as both a photon counter and a photon spectrometer. A quantum-imaging system can function as a photon counter and be configured to measure photon beam fluences (e.g., in J/cm2) for both strong beams and weak beams, the latter ones, for example, in the intensity range of 1 pJ/cm2sec, or 0.1 μSv/h. The quantum-imaging system can also function as a photon spectrometer and can be configured to measure photon energies with high energy resolution such as, for example, 1% of photon energy.
申请公布号 US7781739(B1) 申请公布日期 2010.08.24
申请号 US20090403639 申请日期 2009.03.13
申请人 PHYSICAL OPTICS CORPORATION 发明人 JANNSON TOMASZ;PRADHAN RANJIT;GERTSENSHTEYN MICHAEL;GRUBSKY VICTOR;MARIENKO IGOR;MEDVEDKIN GENNADY;MENGESHA WONDWOSEN;ROMANOV VOLODYMYR;YANG YUNPING
分类号 G01T1/185 主分类号 G01T1/185
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