发明名称 Methods of manufacturing metal-silicide features
摘要 A method of manufacturing a microelectronic device including forming a dielectric layer surrounding a dummy feature located over a substrate, removing the dummy feature to form an opening in the dielectric layer, and forming a metal-silicide layer conforming to the opening by a metal deposition process employing a target which includes metal and silicon. The metal-silicide layer may then be annealed.
申请公布号 US7781316(B2) 申请公布日期 2010.08.24
申请号 US20070838376 申请日期 2007.08.14
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 LIN CHEN-TUNG;CHANG CHIH-WEI;WU CHII-MING;WANG MEI-YUN;CHUANG CHIANG-MING;SHUE SHAU-LIN
分类号 H01L21/44;C30B1/00;H01L21/20;H01L21/28;H01L21/285;H01L21/321;H01L21/336;H01L21/36;H01L21/4763;H01L21/768;H01L23/485;H01L29/06 主分类号 H01L21/44
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