A SEMICONDUCTOR MEMORY AND TESTING METHOD THEREFOR,申请号KR20080097124-传众专利搜索

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发明名称	A SEMICONDUCTOR MEMORY AND TESTING METHOD THEREFOR
摘要
申请公布号	KR100977730(B1)	申请公布日期	2010.08.24
申请号	KR20080097124	申请日期	2008.10.02
申请人		发明人
分类号	G11C7/10;G11C5/14;G11C29/00	主分类号	G11C7/10
代理机构		代理人
主权项
地址

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