Method for the analysis of impurities using secondary ion mass spectroscopy,申请号KR20080065500-传众专利搜索

首页产品黄页商标征信

会员服务注册登录

法人/股东/高管

发明名称	Method for the analysis of impurities using secondary ion mass spectroscopy
摘要
申请公布号	KR100977194(B1)	申请公布日期	2010.08.20
申请号	KR20080065500	申请日期	2008.07.07
申请人		发明人
分类号	G01N27/62;G01N21/33	主分类号	G01N27/62
代理机构		代理人
主权项
地址

您可能感兴趣的专利

CARD TYPE MOVING IMAGE RECORDING/REPRODUCING MACHINE

MOBILE TERMINAL DEVICE

FIXING STRUCTURE, AND FIXING METHOD

WIDE BANDGAP SEMICONDUCTOR DEVICE

ALUMINUM ELECTROLYTIC CAPACITOR

METHOD OF MANUFACTURING CAPACITIVE INPUT SWITCH AND CAPACITIVE INPUT SWITCH

WEB RELAY SERVER DEVICE AND WEB PAGE BROWSING SYSTEM

MEMORY CONTROLLER, MEMORY SYSTEM, AND ADDRESS CONVERSION METHOD

TRAVELLING LANE IDENTIFICATION DEVICE, LANE CHANGE SUPPORT DEVICE, AND TRAVELLING LANE IDENTIFICATION METHOD

SUBMISSION MESSAGE OUTPUT DEVICE

FIXING DEVICE AND IMAGE FORMING APPARATUS

DEVELOPING APPARATUS, PROCESS CARTRIDGE, AND IMAGE FORMING APPARATUS

DEVELOPING APPARATUS

IMAGE FORMING APPARATUS

ROTATION ANGLE DETECTION DEVICE

DRIVING SUPPORT SYSTEM, DRIVING SUPPORT METHOD, AND DRIVING SUPPORT PROGRAM

IGNITION TORCH EXTREMITY END STRUCTURE

VEHICULAR TRANSMISSION DEVICE