发明名称 METHOD OF MEASURING I-V CHARACTERISTICS OF SOLAR CELL, AND SOLAR CELL
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a method of measuring I-V characteristics of a solar cell that can improve measurement precision, and to provide the solar cell. <P>SOLUTION: The method of measuring I-V characteristics of the solar cell includes the steps of: bringing a probe pin 51 for voltage measurement into contact with a first connection line 40A; bringing two or more probe pins 50 for current measurement, which are electrically connected to one another, into contact with two or more thin-line electrodes including thin-line electrodes coupled by the first connection line 40A among a plurality of first thin-line electrodes 30A; and applying a voltage to the first connection line 40A with the probe pin 51 for measurement while irradiating a light reception surface FS with light. The first connection line 40A has a larger line width than the first thin-line electrodes 309A. <P>COPYRIGHT: (C)2010,JPO&INPIT</p>
申请公布号 JP2010182969(A) 申请公布日期 2010.08.19
申请号 JP20090026640 申请日期 2009.02.06
申请人 SANYO ELECTRIC CO LTD 发明人 TAIRA SHIGEJI;NISHIWAKI TAKESHI
分类号 H01L31/04 主分类号 H01L31/04
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