| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a semiconductor device which easily repair a connected memory irrespective of whether a repair circuit is mounted on the connected memory. <P>SOLUTION: A semiconductor device 1 includes a BIST circuit 42 which detects a defective bit of a connected DRAM, and obtains an address of the detected defective bit, a nonvolatile eFuse macro 13 holding the address of the defective bit of the DRAM 2 detected by the BIST circuit 42, and a repair register 51 storing bit information of the address of the defective bit. The semiconductor device 1 also includes an address controller 44 controlling so as to use the repair register 51 during writing or reading of data of the address of the defective bit, based on the address retained in the eFuse macro 13 at the time of power-on-reset. <P>COPYRIGHT: (C)2010,JPO&INPIT</p> |
