| 摘要 |
Provided is a test apparatus that tests a device under test, having two operational modes which are (i) an edge strobe mode in which the test apparatus judges acceptability of a value of an output signal from the device under test at sequentially designated reference timings, based on expected value information, and (ii) a multi-strobe mode in which the test apparatus judges the acceptability of values of the output signal at a plurality of strobes for each reference timing, based on expected value information, the plurality of strobes being generated based on the reference timing, and comprising a conversion control section that converts an expected value pattern supplied thereto into expected value information to be used in the edge strobe mode or into expected value information to be used in the multi-strobe mode, depending on which of the edge strobe mode and the multi-strobe mode is selected.
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