发明名称 MEASUREMENT METHOD OF SYSTEM PARAMETER OF LINEAR MULTI-PORT AND MEASUREMENT METHOD USING VECTOR NETWORK ANALYZER
摘要 PROBLEM TO BE SOLVED: To provide a novel measurement method of a system parameter of five-port junction used for a vector network analyzer (VNA). SOLUTION: The VNA is an apparatus for measuring an amplitude ratio and a phase difference (S parameter: a scattering matrix element) between an incident wave and a reflection wave or between the incident wave and a transmission wave of a to-be-measured device (DUT). As a new knowledge, the S parameter is expressed by linear coupling using H and a power differential ratio (äP(S)/P(0)}-1) in the five-port junction. The parameter H is directly calculated by the new knowledge. The parameter H is simply calculated and derived by using at least three known standards. The calculation quantity is reduced in comparison with a conventional apparatus. COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010181226(A) 申请公布日期 2010.08.19
申请号 JP20090023816 申请日期 2009.02.04
申请人 CHUO ELECTRONICS CO LTD;UNIV OF ELECTRO-COMMUNICATIONS;CAMPUS CREATE CO LTD 发明人 KONDO HAJIME;YAKABE TOSHIYUKI;YABE HATSUO
分类号 G01R27/28 主分类号 G01R27/28
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