发明名称 |
MEASUREMENT METHOD OF SYSTEM PARAMETER OF LINEAR MULTI-PORT AND MEASUREMENT METHOD USING VECTOR NETWORK ANALYZER |
摘要 |
PROBLEM TO BE SOLVED: To provide a novel measurement method of a system parameter of five-port junction used for a vector network analyzer (VNA). SOLUTION: The VNA is an apparatus for measuring an amplitude ratio and a phase difference (S parameter: a scattering matrix element) between an incident wave and a reflection wave or between the incident wave and a transmission wave of a to-be-measured device (DUT). As a new knowledge, the S parameter is expressed by linear coupling using H and a power differential ratio (äP(S)/P(0)}-1) in the five-port junction. The parameter H is directly calculated by the new knowledge. The parameter H is simply calculated and derived by using at least three known standards. The calculation quantity is reduced in comparison with a conventional apparatus. COPYRIGHT: (C)2010,JPO&INPIT
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申请公布号 |
JP2010181226(A) |
申请公布日期 |
2010.08.19 |
申请号 |
JP20090023816 |
申请日期 |
2009.02.04 |
申请人 |
CHUO ELECTRONICS CO LTD;UNIV OF ELECTRO-COMMUNICATIONS;CAMPUS CREATE CO LTD |
发明人 |
KONDO HAJIME;YAKABE TOSHIYUKI;YABE HATSUO |
分类号 |
G01R27/28 |
主分类号 |
G01R27/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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