发明名称 Emissions Monitoring Apparatus, System, and Method
摘要 Some embodiments of the invention generally relate to an apparatus configured to monitor emissions. The apparatus includes a sampling chamber, a gas analyzer, and a particulate matter analyzer. The sampling chamber is configured to receive a portion of an exhaust flow from an exhaust stack. The portion of the exhaust flow comprises one or more gases and particulate matter. The gas analyzer is configured to receive the portion of the exhaust flow to measure at least one emission level of the one or more gases using a laser and output a signal indicative thereof. The particulate matter analyzer is operatively connected to the sampling chamber and is configured to measure the particulate matter using optics and output a signal indicative thereof.
申请公布号 US2010206042(A1) 申请公布日期 2010.08.19
申请号 US20090633156 申请日期 2009.12.08
申请人 W R SYSTEMS, LTD. 发明人 JOHNS ROBERT G.;VIRAY REGINALD L.;WEAVER EDWARD P.;LUNDIN NATHAN J.;JONES MEGAN
分类号 G01N33/00;F01N11/00;G01N21/00 主分类号 G01N33/00
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