| 摘要 |
An inspection system is disclosed. The system comprises a CT apparatus. The CT apparatus includes a gantry, a radiation source connected with the gantry, a detection device connected with the gantry substantially opposite the radiation source, and a transfer device for transferring an object under inspection. The detection device comprises N rows of detectors arranged at predetermined intervals, where N is an integer greater than 1. With the inspection system according to the present invention, the CT apparatus can perform scanning imaging at a high rate to enable the CT apparatus and an scanning imaging device for obtaining a two-dimensional image of an object under inspection to simultaneously operate, thereby compensating each other's insufficiency. |
