| 摘要 |
PURPOSE: A blade and a wafer of a probe unit for the test of a LCD are provided to improve LCD characteristics inspection efficiency. CONSTITUTION: An upper blade(100) of an A type juts out a pattern contact unit(120) in one end upper side of a blade body(110) which has a predetermined width and length. The upper blade of A type juts out a panel contact unit(130) in the lower side of the other end part of the blade body. The upper blade of A type juts out fixed protrusions(140,150) in one part upper end of the blade body. A square hole(160,170) is formed in a fixed projecting part. The pattern contact unit and the panel contact unit can be used as a spring which uniformly distributes pressure. |
