发明名称 METHOD AND SYSTEM FOR TESTING RFID TAGS
摘要 The present invention provides a method and a system for testing RFID tags, which utilizes a way of adjusting the distance between the RFID tags and interrogator or adjusting the power of the interrogator accompanied with a shielding procedure for testing and classifying the RFID tags. By means of the method and the system of the present invention, it is capable of judging the efficacy and good and bad of the RFID tags, while the interrogatable distance of the RFID tags is capable of being tested effectively.
申请公布号 US2010207729(A1) 申请公布日期 2010.08.19
申请号 US20090575077 申请日期 2009.10.07
申请人 INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE 发明人 KO MING-HSIEN;CHEN HUI-TA;ZHUANG CHUAN-SHENG;LIN CHING-CHIH;CHANG CHUN-HAO;KAO CHIH-HUNG
分类号 H04Q5/22;B65G43/08 主分类号 H04Q5/22
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