发明名称
摘要 <p>A semiconductor device should have a structure that allows locating electronic components in a region under a bonding pad. The semiconductor device includes a bonding pad constituting the external connection terminal; a region under the bonding pad including at least two copper layers and a connection via plug, under said bonding pad, disposed so as to connect copper layers that form a pair out of the at least two copper layers; a seal ring constituted of an annular conductor, disposed so as to surround the region under the bonding pad, and to connect a lower one of the copper layers that form said pair to copper layer to form a pair with the lower copper layer; and an interconnect connected to the bonding pad outside the seal ring.</p>
申请公布号 JP4528035(B2) 申请公布日期 2010.08.18
申请号 JP20040180628 申请日期 2004.06.18
申请人 发明人
分类号 H01L21/60;H01L21/3205;H01L21/82;H01L21/822;H01L23/12;H01L23/48;H01L23/485;H01L23/52;H01L27/04 主分类号 H01L21/60
代理机构 代理人
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