发明名称 |
OXIDE SEMICONDUCTOR MATERIAL, METHOD FOR MANUFACTURING OXIDE SEMICONDUCTOR MATERIAL, ELECTRONIC DEVICE AND FIELD EFFECT TRANSISTOR |
摘要 |
The present invention provides an oxide semiconductor material, a method for manufacturing such oxide semiconductor material, an electronic device and a field effect transistor. The oxide semiconductor material contains Zn, Sn, and O, does not contain In, and has an electron carrier concentration higher than 1 × 10 15 /cm 3 and less than 1 × 10 18 /cm 3 . The electronic device comprises a semiconductor layer formed of the oxide semiconductor material, and an electrode provided on the semiconductor layer. The field effect transistor comprises a source electrode and a drain electrode which are arranged in separation from each other on the semiconductor layer; and a gate electrode placed at a position where the gate electrode can apply a bias potential to a region of the semiconductor layer positioned between the source electrode and the drain electrode.
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申请公布号 |
EP2219225(A1) |
申请公布日期 |
2010.08.18 |
申请号 |
EP20080850158 |
申请日期 |
2008.11.12 |
申请人 |
SUMITOMO CHEMICAL COMPANY, LIMITED |
发明人 |
HASEGAWA, AKIRA;KOHIRO, KENJI;FUKUHARA, NOBORU |
分类号 |
H01L29/786;C23C14/08;C23C14/34;H01L21/02;H01L29/26 |
主分类号 |
H01L29/786 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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