发明名称 PLASMA CLEANING METHOD
摘要 <p>A plasma cleaning gas for CVD chamber is a gas for cleaning silicon-containing deposits on the surface of a CVD chamber inner wall and the surfaces of members placed inside the CVD chamber after film forming treatment on a substrate by a plasma CVD apparatus. The cleaning gas includes 100% by volume of fluorine gas which gas can generate plasma by electric discharge. When 100% by volume of fluorine gas is plasma-generated by electric discharge and then used as a cleaning gas, an extremely excellent etching rate can be attained and further plasma can be stably generated even in the total gas flow rate of 1000 sccm and at a chamber pressure of 400 Pa. Further, the uniformity of cleaning can be also ensured in the above conditions. Additionally the fluorine gas concentration is 100% so that the apparatus is not complicated and thereby the cleaning gas has excellent practicability.</p>
申请公布号 EP1437768(B1) 申请公布日期 2010.08.18
申请号 EP20020758871 申请日期 2002.08.26
申请人 NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCEAND TECHNOLOGY;ANELVA CORPORATION;ULVAC, INC.;KANTO DENKA KOGYO CO., LTD.;SANYO ELECTRIC CO., LTD.;SHOWA DENKO K.K.;SONY CORPORATION;DAIKIN INDUSTRIES, LTD.;TOKYO ELECTRON LIMITED;NEC ELECTRONICS CORPORATION;HITACHI KOKUSAI ELECTRIC INC.;PANASONIC CORPORATION;RENESAS TECHNOLOGY CORP.;ASAHI GLASS COMPANY, LIMITED 发明人 SEKIYA,A;MITSUI,Y;OHIRA,Y;YONEMURA,T
分类号 C23C16/44;B08B7/00;H01L21/3065 主分类号 C23C16/44
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