发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
摘要 <p>PURPOSE: A semiconductor integrated circuit device is provided to improve the reliability by preventing the generation of short-circuit in adjacent sharing contacts which are formed on a gate electrode. CONSTITUTION: A gate line(130) is expanded to one direction. An active region is adjacently arranged to one lateral end of the gate line and is expanded to the other direction. A silicide film is formed on the upper side of the active region, on both sidewalls of the lateral end of the gate line, and on the end part sidewall of the gate line. A spacer(140) is formed on the sidewalls of the other lateral end of the gate line. A sharing contact(250) is formed on the one lateral end of the gate line.</p>
申请公布号 KR20100090982(A) 申请公布日期 2010.08.18
申请号 KR20090010238 申请日期 2009.02.09
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 SHIN, DONG SUK;CHANG, CHONG KWANG
分类号 H01L27/11;H01L21/8244 主分类号 H01L27/11
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