发明名称 Resistance variable memory device and programming method thereof
摘要 Provided is a method of programming a resistance variable memory device. The resistance variable memory device includes a memory cell having multi states and a write driver outputting a program pulse for programming the memory cell into one of the multi states. The method of programming the resistance variable memory device includes applying a first program pulse to the resistance variable memory device and applying a second program pulse to a memory cell when the memory cell is programmed into an intermediate state. When the first program pulse is a reset pulse, the reset pulse is an over program pulse, that is, an over reset pulse. Therefore, the resistance variable memory device can secure a sufficient read margin as well as improve a resistance drift margin.
申请公布号 US7778066(B2) 申请公布日期 2010.08.17
申请号 US20080228914 申请日期 2008.08.18
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 HORII HIDEKI;BAE JUN-SOO
分类号 G11C11/00 主分类号 G11C11/00
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