发明名称 DC offset calibration apparatus and method for differential signals
摘要 A DC offset calibration apparatus includes a first adjustment unit, a first offset calibration circuit, a second adjustment unit, and a second offset calibration circuit. The first adjustment unit adjusts a first input signal to generate a first output signal according to a first offset calibration signal. The first offset calibration circuit is coupled to the first output signal and the first adjustment unit for determining the first offset calibration signal according to the first output signal and predetermined threshold value. The second adjustment unit adjusts a second input signal to generate a second output signal according to a second offset calibration signal. The second offset calibration circuit is coupled to the second output signal and the second adjustment unit for determining the second offset calibration signal according to the second output signal and the predetermined threshold value. The first and the second input signals are a differential signal pair.
申请公布号 US7777546(B2) 申请公布日期 2010.08.17
申请号 US20080968623 申请日期 2008.01.02
申请人 REALTEK SEMICONDUCTOR CORP. 发明人 LIU REN-CHIEH
分类号 H03L5/00 主分类号 H03L5/00
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