发明名称 |
Automated self test for a thermal processing system |
摘要 |
Described are computer-based methods and apparatuses for automated self test for a thermal processing system. A signal to execute the automated self test is received. The automated self test is executed. The execution includes executing one or more self test instructions for the one or more subsystems of the system. Data can be received from sensors associated with the subsystems. The data can be analyzed to determine the results of the automated self test for the thermal processing system.
|
申请公布号 |
US7778799(B2) |
申请公布日期 |
2010.08.17 |
申请号 |
US20070619149 |
申请日期 |
2007.01.02 |
申请人 |
HYPERTHERM, INC. |
发明人 |
BRANDT AARON DONALD;ANDERSON RICHARD RAY;PASSAGE CHRISTOPHER SCOTT;CHIN WAYNE |
分类号 |
G06F19/00;G06F17/40 |
主分类号 |
G06F19/00 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|