发明名称 Integrated circuit device and fabrication method therefor
摘要 In a temperature sensor section of a semiconductor integrated circuit device, wires of the topmost wiring layer of a multi-layer wiring structure are formed. A sheet-like temperature monitor element of vanadium oxide is provided between two of the wires in such a way as to cover the two wires. Accordingly, the temperature monitor element is connected between the two wires of an underlying wiring layer of the multi-layer wiring structure through two vias and the two wires of the topmost wiring layer.
申请公布号 US7777288(B2) 申请公布日期 2010.08.17
申请号 US20050052215 申请日期 2005.02.08
申请人 NEC ELECTRONICS CORPORATION;NEC CORPORATION 发明人 KAWAHARA NAOYOSHI;MURASE HIROSHI;OHKUBO HIROAKI;KIKUTA KUNIKO;NAKASHIBA YASUTAKA;ODA NAOKI;SASAKI TOKUHITO;ITO NOBUKAZU
分类号 H01L21/768;H01L31/058;H01C7/10;H01L21/822;H01L23/58;H01L27/04;H01L27/06;H01L27/16 主分类号 H01L21/768
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