发明名称 READING METHOD OF NONVOLATILE MEMORY DEVICE, AND NONVOLATILE MEMORY DEVICE IMPLEMENTING THE SAME
摘要 PURPOSE: A reading method of a nonvolatile memory device, and the nonvolatile memory device implementing the same are provided to increase production yield by improving an error of reading out. CONSTITUTION: A read-out margin threshold output unit(200) produces a read-out margin threshold between a read out voltage and the threshold voltage of the cell. An interference output unit(100) outputs a interference value giving an interference to the threshold voltage of the cell. A comparison unit(300) compares the threshold with the interference value. A coefficient storage unit stores an interference factor receiving influence in programming.
申请公布号 KR20100090439(A) 申请公布日期 2010.08.16
申请号 KR20090009708 申请日期 2009.02.06
申请人 HYNIX SEMICONDUCTOR INC. 发明人 LEE, SANG KYU;CHUNG, SEUNG JAE
分类号 G11C16/26;G11C16/30;G11C16/34 主分类号 G11C16/26
代理机构 代理人
主权项
地址