发明名称 PHASE-CHANGE MEMORY UNIT, METHOD OF FORMING THE SAME, AND PHASE-CHANGE MEMORY DEVICE INCLUDING THE SAME
摘要 <p>PURPOSE: A phase-change memory unit, a method of forming the same, and a phase-change memory device including the same are provided to improve electrical characteristic by heating a phase change material layer pattern with small current and reducing a reset current. CONSTITUTION: A first lower electrode structure(170) is formed on an ohmic layer(140). The first lower electrode structure comprises a first bottom electrode(174) and a second bottom electrode(172). The first bottom electrode comprises a first metal nitride having a first specific resistance. The second bottom electrode comprises a second metal nitride having a second specific resistance lower than the first specific resistance. A phase change material layer pattern(180) is formed on the lower electrode structure. The top electrode(190) is formed on the phase change material layer pattern.</p>
申请公布号 KR20100089132(A) 申请公布日期 2010.08.12
申请号 KR20090008228 申请日期 2009.02.03
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LIM, HYUN SEOK;LIM, TAI SOO;LEE, HYUN SUK
分类号 H01L27/115;H01L21/8247 主分类号 H01L27/115
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