发明名称 SYSTEM AND METHOD FOR TREATING SUBSTRATE
摘要 PROBLEM TO BE SOLVED: To provide a method and a system for treating a substrate. SOLUTION: The system for treating a substrate includes a coating unit, a pre/post-exposure treatment unit, and a developing unit. Each of the units includes a load port and an index module. The pre/post-exposure treatment unit includes first and second modules that are arranged in different layers. The first module performs a step for coating a protective layer on the wafer before an exposure step. The second module performs a step for cleaning the wafer and a post-exposure bake step after the exposure step. COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010177672(A) 申请公布日期 2010.08.12
申请号 JP20100019559 申请日期 2010.01.29
申请人 SEMES CO LTD 发明人 KIMU DONHO;CHOI JINYOUNG;GO JAE SEUNG;HWANG SOOMIN
分类号 H01L21/027 主分类号 H01L21/027
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