发明名称 RADIATION-SENSITIVE RESIN COMPOSITION AND RESIST PATTERN FORMING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a radiation-sensitive resin composition which is a material of a resist film capable of obtaining good pattern configuration, less liable to elute into an immersion liquid for liquid immersion lithography, such as water, having a large receding contact angle to the immersion liquid, and less liable to cause development defects. <P>SOLUTION: The radiation-sensitive resin composition contains: a first polymer (A) having predetermined repeating units; a second polymer (B) which has an acid-dissociable functional group dissociating under the action of an acid and becomes alkali-soluble upon the dissociation of the acid-dissociable functional group; and a radiation-sensitive acid generator (C). <P>COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010176036(A) 申请公布日期 2010.08.12
申请号 JP20090020992 申请日期 2009.01.30
申请人 JSR CORP 发明人 NARUOKA TAKEHIKO;MATSUMURA SHINJI;ASANO YUSUKE;SAKAKIBARA HIROKAZU;NISHIMURA YUKIO;SHIMIZU MAKOTO
分类号 G03F7/039;C08F222/20;C08L33/16;G03F7/004;G03F7/38;H01L21/027 主分类号 G03F7/039
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