发明名称 ADDRESS COMPARATOR IN SEMICONDUCTOR MEMORY DEVICE
摘要 PURPOSE: An address comparator in a semiconductor memory device is provided to improve the degree of integration of a component by installing a redundancy latch unit outputting a comparison signal and a redundancy enable signal output unit which outputs a redundancy enable signal according to the comparison signal. CONSTITUTION: A plurality of redundancy latch units(100) latches redundancy data. The redundancy latch units output the comparison signal by comparing the latched redundancy data and the column address. A redundancy enable signal output unit(200) outputs the redundancy enable signal in response to a plurality of comparison signals outputted from the redundancy latch units.
申请公布号 KR20100089506(A) 申请公布日期 2010.08.12
申请号 KR20090008794 申请日期 2009.02.04
申请人 HYNIX SEMICONDUCTOR INC. 发明人 LEE, WAN SEOB
分类号 G11C8/04;G11C29/00 主分类号 G11C8/04
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