发明名称 |
SELECTABLE DUAL MODE TEST ACCESS PORT METHOD AND APPARATUS |
摘要 |
A process of selecting alternative test circuitry within an integrated circuit enables a test access port. Scan test instruction data is loaded into an instruction register of a test access port TAP, the instruction data including information for selecting the alternative test circuitry. An Update-IR instruction update operation is performed at the end of the loading to output scan test control signals from the instruction register. A lockout signal is changed to an active state to disable the test access port and enable scan test circuits.
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申请公布号 |
US2010205494(A1) |
申请公布日期 |
2010.08.12 |
申请号 |
US20100763781 |
申请日期 |
2010.04.20 |
申请人 |
TEXAS INSTRUMENTS INCORPORATED |
发明人 |
WHETSEL LEE D. |
分类号 |
G01R31/3177;G01R31/3185;G06F11/25 |
主分类号 |
G01R31/3177 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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