发明名称 ETCHING METHOD, SEMICONDUCTOR AND FABRICATING METHOD FOR THE SAME
摘要 An organic/inorganic hybrid film represented by SiCxHyOz (x>0, y≧0, z>0) is plasma-etched with an etching gas containing fluorine, carbon and nitrogen. During the etching, a carbon component is eliminated from the surface portion of the organic/inorganic hybrid film due to the existence of the nitrogen in the etching gas, to thereby reform the surface portion. The reformed surface portion is nicely plasma-etched with the etching gas containing fluorine and carbon.
申请公布号 US2010203733(A1) 申请公布日期 2010.08.12
申请号 US20100766243 申请日期 2010.04.23
申请人 PANASONIC CORPORATION 发明人 KANEGAE KENSHI;IMAI SHINICHI;NAKAGAWA HIDEO
分类号 H01L21/302;H01L21/467;H01L21/3065;H01L21/3105;H01L21/311;H01L21/312;H01L21/4763;H01L21/768;H01L23/522 主分类号 H01L21/302
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