发明名称 |
METHOD AND INSTRUMENT FOR OPTICAL THICKNESS MEASUREMENT OF TRANSPARENT OR SEMITRANSPARENT MATERIALS |
摘要 |
This invention concerns a method and an instrument for optical measuring of the thickness of materials in form of transparent or semitransparent film which comprises in combination optical lighting components, signal receiving components, control and supervisor components, all integrated and contained in a sole body. The measuring instrument is as a whole applicable to a production line of the material that has to be measured, both in fixed and dynamic position, is interfaced with remote display interface and could be interfaced and interact with a possible control system of the operating of the production line it is connected with. |
申请公布号 |
WO2010089793(A2) |
申请公布日期 |
2010.08.12 |
申请号 |
WO2010IT00035 |
申请日期 |
2010.02.04 |
申请人 |
NIROX S.R.L.;BANDERA, ANDREA;DONINI, MAURIZIO;PASQUALI, ANDREA |
发明人 |
BANDERA, ANDREA;DONINI, MAURIZIO;PASQUALI, ANDREA |
分类号 |
G01B11/06 |
主分类号 |
G01B11/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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