SEMICONDUCTOR DEVICE, POWER SUPPLY CURRENT MEASURING DEVICE AND METHOD OF MEASURING POWER SUPPLY

摘要

A semiconductor device has an input/output terminal configured to input test patterns, a plurality of function blocks configured to be driven by power supply voltage supplied through separate power supply lines, an internal bus configured to send and receive at least the test patterns between the function blocks and the input/output terminal, and an input control circuit which is provided corresponding to each of the plurality of function blocks and switches whether to provide the test patterns on the internal bus to the corresponding function block based on a mode setting signal.