| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To detect the abnormality of the radiation from the radiation surface of a Peltier element for cooling an X-ray detector without bringing about a large increase in cost. <P>SOLUTION: At the point of time when time t1 is elapsed after the control of temperature is started, the abnormality of the Peltier element is detected from the relation between the voltage applied to the Peltier element and the drive current of the Peltier element (S1-S8). Thereafter, at the point of time when time t2 is elapsed, the temperature lowering quantity (temperature difference)ΔT during the period from t1 to t2 is calculated and a cooling speedΘis calculated fromΔT (S9-S12). If the cooling speedΘis below a threshold valueΘ1 preliminarily calculated under the highest use temperature condition (No in S13), radiation is determined to be abnormal to perform the information of abnormality (S15). <P>COPYRIGHT: (C)2010,JPO&INPIT</p> |
