DEVICE FOR DETECTING ERROR OF TEST PROGRAM OF SEMICONDUCTOR

摘要

PURPOSE: A test program error detecting apparatus of a semiconductor memory device is provided to improve the reliability of a test. CONSTITUTION: An address signal generator(10) successively inputs the address signal of the cell to the internally mounted data input output circuit from the outside. A row address signal and a column address signal of the input address are generated. A latch unit(20) latches the phase data of the row address signal and the column address signal in response to a control signal of test program error detection. A comparator(30) compares the phase data of latched input address to output the phase data determining as to the occurrence of test program error.