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发明名称
X-ray inspection system with coordination between detector and multiple focal spots
摘要
申请公布号
EP1840935(B1)
申请公布日期
2010.08.11
申请号
EP20070104944
申请日期
2007.03.27
申请人
GENERAL ELECTRIC COMPANY
发明人
BIRDWELL, THOMAS WILLIAM;GALISH, ANDREW JOSEPH
分类号
H01J35/30;H05G1/52
主分类号
H01J35/30
代理机构
代理人
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