发明名称 Color metric for halo artifacts
摘要 A method of evaluating halo artifacts is described herein. The method utilizes a pattern of color patches, a color space and color difference metrics to analyze color changes which correlate to the amount of halo. The pattern of color patches is utilized in the CIE L*a*b* color space to determine an area of patch unaffected by halo of the pattern of color patches. After the area of patch unaffected by halo is determined, a Reference Value is computed by averaging the CIE L*a*b* color for the area of patch unaffected by halo. Then an Artifact Value is calculated either by averaging the CIE L*a*b* color for the area outside the area of patch unaffected by halo but before the margin or by averaging the CIE L*a*b* color on the edge of the patch. Once these values are determined, the halo quantity is calculated.
申请公布号 US7773257(B2) 申请公布日期 2010.08.10
申请号 US20060591662 申请日期 2006.10.30
申请人 SONY CORPORATION;SONY ELECTRONICS INC. 发明人 CIUREA FLORIAN;BERESTOV ALEXANDER;DEGUCHI TATSUYA;KATOH NAOYA
分类号 G06F15/00 主分类号 G06F15/00
代理机构 代理人
主权项
地址