发明名称 METHOD OF INSPECTING COMPOSITION OF MATERIAL DURING STRUCTURE FORMATION
摘要 FIELD: physics. ^ SUBSTANCE: in the method of inspecting composition of material during structure formation, ellipsometric parametres ¿ and ö are measured and the derivative is calculated during layer formation. The function used is one of the ellipsometric parametres and the argument is the other ellipsometric parametre. Calculation results are fixed in a plane. The derivative of the ellipsometric parametre is an ellipsometric parametre in form of a curve from which optical constants and change in composition of the material of the layer. The derivative of the ellipsometric parametre is calculated with accuracy which is sufficient for representing the derivative of the ellipsometric parametre - ellipsometric parametre for correlation of the obtained curves with inspected layers with a different composition gradient which is given by the ellipsometre used during inspection. ^ EFFECT: possibility of non-destructive inspection of material as structures grow, including in multi-layer structures characterised by significant composition gradient. ^ 9 cl, 4 dwg, 4 ex
申请公布号 RU2396545(C1) 申请公布日期 2010.08.10
申请号 RU20080152997 申请日期 2008.12.31
申请人 UCHREZHDENIE ROSSIJSKOJ AKADEMII NAUK INSTITUT FIZIKI POLUPROVODNIKOV IM. A.V. RZHANOVA SIBIRSKOGO OTDELENIJA RAN 发明人 MIKHAJLOV NIKOLAJ NIKOLAEVICH;DVORETSKIJ SERGEJ ALEKSEEVICH;SHVETS VASILIJ ALEKSANDROVICH
分类号 B82B3/00;G01N21/17;H01L21/66 主分类号 B82B3/00
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