发明名称 |
Automatic test equipment capable of high speed test |
摘要 |
Automatic test equipment is capable of performing a high-speed test of semiconductor devices, with a low cost and high efficiency. The automatic test equipment (ATE) comprises: an ATE body configured to electrically test semiconductor devices; a field programmable gate array (FPGA) controlling drivers and comparators on the ATE; an accelerator connected to an output terminal of the FPGA and that doubles an operating frequency of the FPGA; and a decelerator connected to an output terminal of the FPGA and that converts an operating frequency of data transferred from the semiconductor device to the operating frequency of the FPGA.
|
申请公布号 |
US7772828(B2) |
申请公布日期 |
2010.08.10 |
申请号 |
US20080072444 |
申请日期 |
2008.02.26 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
JANG CHUL-WOONG;JANG SEUNG-HO;LEE JAE-IL;LEE YOUNG-JIN |
分类号 |
G01R15/18 |
主分类号 |
G01R15/18 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|