发明名称 Semiconductor heterostructure and method for forming same
摘要 The invention relates to a method for forming a semiconductor heterostructure by providing a substrate with a first in-plane lattice parameter a1, providing a buffer layer with a second in-plane lattice parameter a2 and providing a top layer over the buffer layer. In order to improve the surface roughness of the semiconductor heterostructure, an additional layer is provided in between the buffer layer and the top layer, wherein the additional layer has a third in-plane lattice parameter a3 which is in between the first and second lattice parameters.
申请公布号 US7772127(B2) 申请公布日期 2010.08.10
申请号 US20050267494 申请日期 2005.11.03
申请人 S.O.I.TEC SILICON ON INSULATOR TECHNOLOGIES 发明人 FIGUET CHRISTOPHE;KENNARD MARK
分类号 H01L21/31;H01L21/469 主分类号 H01L21/31
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