发明名称 Manufacturing method for photo mask
摘要 A method for manufacturing a photo mask includes forming a mask pattern over a transparent substrate; forming a photoresist over the transparent substrate; subjecting the photoresist to an exposure light from the rear of the transparent substrate to form a photoresist pattern on the mask pattern; and correcting a line width in the mask pattern using the photoresist pattern as a mask.
申请公布号 US7771900(B2) 申请公布日期 2010.08.10
申请号 US20070774677 申请日期 2007.07.09
申请人 HYNIX SEMICONDUCTOR INC. 发明人 JEONG GOO MIN
分类号 G03F1/00 主分类号 G03F1/00
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