发明名称 Substrate processing apparatus
摘要 The substrate processing apparatus according to the present invention is aimed to stably and efficiently perform a deposition process on a substrate W. The substrate processing apparatus supports the substrate W in a position facing a heater portion and thus rotates a holding member holding the substrate W. Furthermore, the heating portion houses a SiC heater and a heat reflecting member in an internal portion of a quartz bell jar made of transparent quartz, and depressurizes an internal space of a processing vessel and an internal space of the quartz bell jar at the same time; thereby allowing the thickness of the quartz bell jar to be thinner, and thus improving thermal conductivity of heat from the SiC heater and preventing contamination by the SiC heater.
申请公布号 US7771536(B2) 申请公布日期 2010.08.10
申请号 US20050529191 申请日期 2005.03.24
申请人 TOKYO ELECTRON LIMITED 发明人 HORIGUCHI TAKAHIRO;KUWAJIMA RYO
分类号 C23C16/00;H05B3/14;C23C16/46;C23C16/48;C23F1/00;H01L21/00;H01L21/306;H01L21/31;H01L21/316 主分类号 C23C16/00
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