发明名称 Test unit and test apparatus
摘要 In the digitizer, a plurality of ADCs convert a plurality of analogue signals output from the device to be tested, to digital signals, respectively. The processing circuit is configured as a software-independent circuit and processes a plurality of digital signals output from the plurality of ADCs. The processing circuit is formed on the FPGA. In the processing circuit, the FFT circuit performs complex Fourier transform on two digital signals.
申请公布号 US7774154(B2) 申请公布日期 2010.08.10
申请号 US20070811291 申请日期 2007.06.08
申请人 ADVANTEST CORPORATION 发明人 SATO NORIMASA;INABA KENJI
分类号 G06F19/00;G01R31/316;G06F17/40 主分类号 G06F19/00
代理机构 代理人
主权项
地址