发明名称 Complex pattern generator for analysis of high speed serial streams
摘要 The present invention provides systems, devices and methods for generating user-defined test patterns within serial controller to facilitate signal testing and verification. These user-defined test patterns may be generated to more accurately reflect the actual traffic of a device-under-test or system, as well as allow a test engineer to more accurately test the boundaries of the device or system. In various embodiments of the invention, a programmable patterns generator is provided for generating user-defined test patterns that may be used during a testing procedure. This programmable pattern generator allows a user to define a particular test pattern by providing bit-by-bit test values, by defining a combination of canned sequences, or by supplementing one or more canned sequences with additional test bits.
申请公布号 US7774669(B2) 申请公布日期 2010.08.10
申请号 US20070761320 申请日期 2007.06.11
申请人 LSI CORPORATION 发明人 ROMERO GABRIEL L.;GAUVIN CORALYN S.
分类号 G01R31/28;G01M99/00;G01R31/00;G06F11/00;H04B3/46 主分类号 G01R31/28
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