发明名称 Device and process for measuring the characterisation by reflectometry
摘要 Embodiments relate to a device for measuring characterisation by reflectometry including a source that emits a light beam, a detector, optics for processing and controlling this light beam so as to focus it on a reflective surface to be measured in the form of a spot and to receive it on the detector, command and acquisition modules, a camera and modules for imaging the spot on the detector and on the camera, wherein the camera is connected to the command and acquisition means so as to automatically focus the spot on the reflective surface to be measured and to automatically conjugate the reflective surface to be measured with the surface of the detector.
申请公布号 US7773208(B2) 申请公布日期 2010.08.10
申请号 US20070302793 申请日期 2007.05.29
申请人 COMMISSARIAT A L'ENERGIE ATOMIQUE 发明人 PIOMBINI HERVE;VOARINO PHILIPPE
分类号 G01N21/00 主分类号 G01N21/00
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