发明名称 SENSOR SYSTEM FOR SEMICONDUCTOR MANUFACTURING APPARATUS
摘要 PURPOSE: A sensor-system for a semiconductor manufacturing machine is provided to reduce electrical signal abnormalities including crowbar effect by matching the pull-up networks of a chamber controlling board and a central controlling unit. CONSTITUTION: A first rotating-substrate supporting unit is arranged in a first processing chamber(202). A second rotating-substrate supporting unit is arranged in a second processing chamber. A first sensor-line connects a first sensor with a first chamber board(208). A second sensor-line connects a second sensor with a second chamber board. A central controlling unit(210) determines the rotary speed for the first and the second rotating-substrate supporting units. A remote controlling system transmits controlling parameters to the central controlling unit.
申请公布号 KR20100088589(A) 申请公布日期 2010.08.09
申请号 KR20100009272 申请日期 2010.02.01
申请人 APPLIED MATERIALS, INC. 发明人 SCHAUER RONALD VERN;DASCOLI RAPHAEL;BHARGAVA SHIVAN
分类号 H01L21/02;H01L21/203 主分类号 H01L21/02
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