发明名称 Isolation Region Implant and Structure
摘要 A method and structure for modulating the threshold voltage of transistor is provided. An opening for an isolation region is formed within a substrate using a masking layer. The masking layer is then pulled back from the opening, and dopants are implanted into the substrate through the exposed surface of the substrate and the sidewalls of the opening. This implantation can be tailored to modulate the threshold voltage of transistors with smaller gate widths without modulating the threshold voltage of other transistors with larger gate widths.
申请公布号 US2010193879(A1) 申请公布日期 2010.08.05
申请号 US20090617515 申请日期 2009.11.12
申请人 发明人 LIAO MING-HAN;LEE TZE-LIANG
分类号 H01L27/088;H01L21/336 主分类号 H01L27/088
代理机构 代理人
主权项
地址