发明名称 |
THREE-DIMENSIONAL SHAPE MEASURING APPARATUS, THREE-DIMENSIONAL SHAPE MEASURING METHOD, THREE-DIMENSIONAL SHAPE MEASURING PROGRAM, AND RECORDING MEDIUM |
摘要 |
An apparatus for measuring a three-dimensional shape of a target object by analyzing an optical pattern projected onto the target object has an optical pattern projecting device that projects the optical pattern onto a portion of a measurement surface on which the target object is placed, the optical pattern having brightness changing periodically according to a position, a first line sensor that images an optical pattern-emitted region onto which the optical pattern is projected, a second line sensor that images an optical pattern-non-emitted region onto which the optical pattern is not projected, and a processing device that calculates a phase of the optical pattern at a pixel included in an image obtained by removing background information from images taken by the first and second line sensors based on a brightness value of the pixel and a neighboring pixel in the image, and calculates height information based on the calculated phase.
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申请公布号 |
US2010195114(A1) |
申请公布日期 |
2010.08.05 |
申请号 |
US20080670998 |
申请日期 |
2008.07.04 |
申请人 |
OMRON CORPORATION |
发明人 |
MITSUMOTO DAISUKE;HONMA YUKI |
分类号 |
G01B11/24;G01B11/245;G01B11/255;G06T1/00 |
主分类号 |
G01B11/24 |
代理机构 |
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代理人 |
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地址 |
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