发明名称 Semiconductor device having electro-static discharge protection element
摘要 A semiconductor device includes a semiconductor substrate of a first conductivity-type, a buried diffusion layer of a second conductivity-type formed in the semiconductor substrate, a first well of the second conductivity-type having a bottom portion in contact with a top portion of the buried diffusion layer, the first well having an annular shape in a planar view, and a second well of the first conductivity-type formed to be surrounded by the first well. The semiconductor device further includes a diffusion region formed between a first portion of the second well and a second portion of the second well, the diffusion region having an impurity concentration lower than that of the second well, so that a depletion layer formed in the diffusion region can be provided, a transistor formed on the second well to function as an ESD (electro-static discharge) protection element, and an external terminal connected to a drain of the transistor.
申请公布号 US2010193869(A1) 申请公布日期 2010.08.05
申请号 US20100656483 申请日期 2010.02.01
申请人 NEC ELECTRONICS CORPORATION 发明人 HABASAKI TADAYUKI
分类号 H01L27/06 主分类号 H01L27/06
代理机构 代理人
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