| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a semiconductor device capable of measuring an impedance adjustment term of an output buffer. Ž<P>SOLUTION: A command latch circuit 2A generates a ZQ Enable signal in accordance with a command signal (ZQ command) from the outside. When the ZQ Enable signal is inputted, a ZQ adjusting circuit 3 performs impedance adjustment of a replica circuit provided inside and outputs its result to a DQ circuit 4 as a driver code. When a test mode signal is inputted, the command latch circuit 2A outputs a DQ signal synchronized to the ZQ Enable signal to the outside of a semiconductor device 100 via the DQ circuit 4. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
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